EC - FP7 CHIPCHECK Project – Counterfeit IC Components Fast In-Line X-Ray Detection

The implementation of an automated X-ray inspection for detecting counterfeit electronic components (primarily integrated circuits) was devoted to presenting the results of a last experiment conducted in optimized conditions, and to achieving a new general draft of such facilities. Experiments were conducted with a TDI type radiation detector but this time we used a microfocus source this combination being ideal for the project’s purpose. Based on the components used and the results obtained was made a general concept design of such a facility dedicated to the automatic detection of counterfeit electronic components and PCBs verification.